Firstly, the configuration of an ATE for digital IC testing is introduced in the thesis, including hardware blocks and f.
集成电路晶圆(Wafer Test)测试是集成电路测试的一种重要方法,是保证集成电路性能、质量的关键环节之一,是发展集成电路产业的一门支撑技术。
IC test is as critical key as to sure the quantity and the development of IC .
集成电路测试是保证集成电路质量、发展的关键手段。
Delay line is a key component of IC test system.
延迟线是集成电路测试系统的关键部件。
The components include hardward of measurement device, programming test software and analysing the IC test results.
内容包括测试设备的硬件选择、测试软件的编写、集成电路测试结果的分析及集成电路的管理等。
linear IC tester
线性集成电路测试仪
logic integrated circuit tester
逻辑集成电路测试仪
digital integrated circuit measuring-testing instrument
数字集成电路测试仪
Research in a Test Method of the Electric Power Metering ASIC
电能计量专用集成电路测试方法研究
keyboard input IC tester
键盘输入集成电路测试机
large scale integrated circuit testing techniques
大规模集成电路测试技术
High Speed Digital Integrated Circuit Testing base on Verigy93000
基于Verigy93000的高速数字集成电路测试
Research on the Test Generation of Digital Integrated Circuits Based on PSO;
基于粒子群算法的数字集成电路测试生成研究
Research and Application of IC Test Instrument Power Circuit Simulation Design
集成电路测试仪电源电路的仿真设计研究与应用
The Research of Calibrating the Error of Linear IC Tester
线性集成电路测试仪误差校验方法的研究
The ICs Test Method Analysis and Simulate Realization;
中小规模集成电路测试方法的分析与仿真实现
Application of Virtual Instruments Technique in HIC Testing;
虚拟仪器技术在厚膜混合集成电路测试中应用
integrated circuit functional tester
集成电路功能测试仪
Application Specific Integrated Circuit Test Research in Memory Testing;
存储测试专用集成电路成测技术研究
Method Analysis and Implementation of Integrated Circuit Electromagnetic Compatibility Test
集成电路电磁兼容性测试方法及实现
integrated circuit DC parameter tester
集成电路直流参数测试仪
linear integrated circuit automatic tester
线性集成电路自动测试仪
digital integrated circuit replay function testing instrument
数字集成电路再现功能测试仪
