In this paper,the knife-edge scanning method is put forward to evaluate the MTF of infrared optical lens.
对刀口边缘扫描法测量红外光学镜头的调制传递函数(MTF)进行了研究,并对f=50mm,F=1。
An optimal FPGA test algorithm based on boundary scan architecture;
一种基于边界扫描的FPGA测试优化生成算法
Design for testability of digital integrated circuits based on boundary scan technology;
基于边界扫描技术的集成电路可测性设计
SRAM cluster of boundary scan interconnect testing at board level;
边界扫描SRAM簇板级互连测试研究
Delay Fault Test in Boundary Scan and Scan Path Architectures
扫描与边界扫描电路延迟故障的测试
Designing and Implementing a Boundary Scan Controller with USB2.0;
基于USB2.0的边界扫描控制器的研制
The Research on Boundary Scan Test Controller with USB Interface;
基于USB接口的边界扫描控制器研制
Designing and Implementing a Boundary Scan Tester with USB Interface;
基于USB总线的边界扫描测试仪的研制
Research on Boundary-scan Test Technique of Electronic Function Module;
电子功能模件边界扫描测试技术研究
Study on the Board Level Test Based on Boundary Scan Technology
基于边界扫描技术的电路板测试研究
Boundary Scan Tester System Supporting SJTAG
支持SJTAG的边界扫描测试系统
Design and Exploitation of a Boundary Scan Test Experiment System
边界扫描测试实验系统的设计与开发
The design of a BSM is the key problem of the implementation of the Boundary Scanning Test System implementation.
主控器设计是边界扫描测试系统设计的重点。
Research of Test Patterns Generation Based on Boundary Scan Test Technology;
基于边界扫描测试技术的测试图形生成的研究
Research of Design for Digital System Testability Based on Boundary-Scan;
基于边界扫描的数字系统可测性设计研究
Boundary-Scan Based Built-in-Self-Test Technology and Its Application;
基于边界扫描的内建自测试技术及其应用
The Software Development of PCB Test System Based on Boundary-scan Technology;
印刷电路板边界扫描软件测试系统研究
Exploration of Boundary Scan Application in In-Circuit Test of Circuit Pack;
电路板在线测试中应用边界扫描技术的探讨
Boundary-Scan Test Research of Board Level and SOPC Design;
边界扫描板级测试技术的研究及SOPC实现
The design of a kind of boundary-scan tester based on virtual instrument technology;
基于虚拟仪器技术的边界扫描测试仪的设计
Technology of Test and Diagnose in Boundary Scan in Digital System Design;
数字系统设计中边界扫描测试诊断策略
Implementation of Mixed-Signal Integrated Circuits Boundary-Scan Test
混合信号集成电路边界扫描测试技术的实现
