The microstructure and morphology of the lead telluride optical thin films prepared by ion beam assisted deposition(IBAD) were observed by atomic force microscopy(AFM).
利用原子力显微镜(AFM)研究了离子束辅助沉积碲化铅(PbTe)薄膜的微观结构和表面形貌。
, Infrared reflectivity spectra with variant parameter PbTe crystal was measured and compared, in order to choose high grade material with low carrier conce- ntration and high mobility.
通过测量碲化铅晶体的红外反射光谱可以比较、分析不同晶体的性能,从而可选出低浓度、高迁移率的优质材料。