A PC_401 computer system was introduced to the double crystal goniometer for small angle scattering measurement.
对双晶衍射仪实行改造，用一台ＰＣ＿４０１微机直接控制和进行小角散射等测量。
Micro area residual stress analysis of ferroelectric films by means of XRD2 technique;
根据在X射线二维衍射几何关系下建立的应力应变方程,提出了一种基于X射线多晶面探衍射仪系统分析射频磁控溅射制备的Pb(Zr,Ti)O3薄膜微区残余应力的测量方法,即通过基于X射线衍射圆锥形变的分析来表征薄膜的残余应力,试验结果表明薄膜所受为残余拉应力,同时利用X射线面探扫描方法评价了薄膜的残余应力分布。
Design and Development of the Control System of RASA-5RP X-ray Diffractometer;
四圆单晶衍射仪控制系统的研制与开发
Di-ffraction bata of 3739 independent reflections were collected on Nicolet XRD R3 fourcircle diffractometer using Mokα radiation.
3739个独立衍射数据由四圆单晶衍射仪用低温技术收集。
single crystal X-ray diffractometer
单晶体x射线衍射仪
automatic single crystal neutron diffractometer
自动单晶中子衍射仪
four crystal X-ray spectrometer
四晶体x射线光谱仪
SINGLE CRYSTAL X-RAY DIFFRACTION CHARACTERISTICS OF MODULATED MINERAL CRYSTALS
调制结构矿物晶体的单晶X射线衍射特征
Elliptically Bent Crystal Spectrometer for Z-Pinch Plasma X-Ray
Z箍缩等离子体X射线椭圆弯晶谱仪
The Error Analysis and Treatnent of the Result of Accurate Measuring Latlice Constant Using Diffractometer
衍射仪精确测定晶格常数的误差分析及处理
Designing Electronic Diffract Instrument High Pressure Power and Manufacturing Crystal Film;
电子衍射仪高压电源设计与晶体薄膜制作
A XRD Method to Measure Orientation of Single Crystal Superalloys
X射线衍射法测量单晶高温合金的取向
Elliptical Crystal Spectrometer for Gas-puff-Pinch Plasma X-Ray
喷气箍缩等离子体X射线椭圆弯晶谱仪研究
Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer
填样深度对多晶粉末X射线衍射仪测试结果的影响研究
circular X-ray diffraction camera
圆形X射线衍射照相机
Technology of Soft X-Ray Diffraction and Sulfur Single-wavelength Anomalous Diffraction in Protein Crystallography
长波长X射线衍射技术与蛋白质晶体中硫的单波长反常散射研究
X-ray Diffractive analysis of Crystal Structure ?
X-射线衍射晶体分析
Applications of Polycrystal X-ray Diffraction
多晶 X射线衍射应用
nondiffraction X-ray spectrometer
非衍射x射线光谱仪
energy dispersive X-ray diffractometer
能量扩散X射线衍射仪
